Specifically designed for measuring fluorescent and various other sample types. Built upon a standard configuration with an added UV light source for accurate color measurement of fluorescent materials. Features 8 measurement apertures (3mm/5mm/10mm/11mm platform + pointed tip) to cover all sample forms. Delivers a repeatability of ΔEab ≤ 0.028 and inter-instrument agreement of ΔEab ≤ 0.35. Data stability is ensured by first-grade metrology certification and a dual-beam optical system. Supports multi-system collaboration and cloud data sharing. Widely applicable in industries such as plastics, electronics, paints, and inks involving fluorescent materials.
Exclusive Fluorescence Measurement: UV light source combined with full-spectrum LED illumination ensures no spectral gaps, accurately capturing the color information of fluorescent samples.
High-Precision Performance: Achieves a repeatability of ΔEab ≤ 0.028 and an inter-instrument agreement of ΔEab ≤ 0.35. The dual-beam optical system design monitors light source energy fluctuations, reducing measurement interference to ensure batch consistency.
Internationally Recognized D/8 SCI/SCE Technology: Employs D/8 SCI/SCE technology, compliant with international standards such as CIE, ISO, and ASTM, meeting color management requirements across multiple industries.
Authoritative Metrology Certification: Certified with first-grade metrology standards. Each unit is factory-calibrated and verified by an authoritative body, with data traceable to national metrology institutes, ensuring reliable results.
Core Optical Components: Dual-row 18-group silicon photodiode array (spectral response 400-700nm) and a nano-integrated spectral device. Ensures no saturation under strong light and high sensitivity in low light for precise data across all wavelength bands.
Full-Band Balanced LED + UV Light Source: Combines a 400-700nm full-band balanced LED with a UV light source, enabling measurement of both regular and fluorescent samples while avoiding spectral gaps.
Advanced Architecture Design: Features an optical resolution of less than 10nm and supports simultaneous SCI/SCE measurement, balancing speed, accuracy, and stability.
Auto Calibration + Precise Targeting: Features non-contact automatic white board calibration (standard white board reflectance ≥95%), combined with real-time camera framing and a stabilizer plate to reduce measurement errors and enable quick mastery.
Multi-System Compatibility: Supports Android, iOS, Windows, HarmonyOS, and other systems. Operable via mobile app, WeChat mini-program, and PC, with cross-device data synchronization.
Ergonomic Design for Easy Measurement: Ergonomic appearance with a large touchscreen and optimized grip design. The clean, intuitive interface requires no complex training.
Full Aperture Coverage: 8 aperture specifications (3/5/10/11mm platform + pointed tip) suitable for samples of various forms, including flat, curved, and concave-convex surfaces.
Multiple Color Spaces and Illuminants:Offers a wide selection of color spaces: CIE LAB, XYZ, Yxy, LCh, CIE LUV, s-RGB, HunterLab, βxy, DIN Lab99.
Provides diverse illuminants: D65, A, C, D50, D55, D75, F1, F2 (CWF), F3, F4, F5, F6, F7 (DLF), F8, F9, F10 (TPL5), F11 (TL84), F12 (TL83/U30), U35, NBF, ID50, ID65.Meets special measurement requirements under different conditions.
Industry Adaptability:Switchable measurement modes for color difference quality control in industries such as plastics, electronics, paints and inks, textile dyeing and printing, printing, and ceramics; includes UV mode for fluorescent sample measurement.
Cloud Data Management: Store up to 500 standards synchronously via the app/mini-program to establish a personal cloud database, enabling data sharing anytime, anywhere.
Professional Software Support: Compatible quality management software supports Android, iOS, Windows, HarmonyOS, and other systems. It generates test reports, compares color differences, and customizes color management workflows to meet industrial-grade quality control requirements.
| Model | KS-220 Spectrophotometer |
| Illumination/Viewing Geometry | D/8 (Diffuse illumination, 8° viewing), SCI/SCE (Specular Component Included/Excluded). Compliant with CIE No.15, GB/T 3978, GB 2893, GB/T 18833, ISO7724-1, ASTM E1164, DIN5033 Teil7. |
| Features | Utilizes a dual-path silicon photodiode array. Ideal for color difference quality control in industries such as plastics, electronics, paints and inks, textile dyeing and printing, printing, and ceramics. |
| Light Source | Combined Full-Spectrum LED Light Source, UV Light Source |
| Integrating Sphere Size | Φ40mm |
| Spectral Device | Nano-integrated spectral device |
| Sensor | Silicon photodiode array (dual-row, 18 groups) |
| Wavelength Range | 400-700nm |
| Wavelength Interval | 10nm |
| Measurement Aperture | 8 Apertures: 3mm platform + 3mm pointed tip+ 5mm platform+ 5mm pointed tip+ 10mm platform+ 10mm pointed tip+11mm platform+ 11mm pointed tip |
| Specular Mode | Simultaneous measurement |
| Color Space | CIE LAB,XYZ,Yxy,LCh,CIE LUV,s-RGB,HunterLab,βxy,DIN Lab99 |
| Color Difference Formula | ΔE*ab,ΔE*uv,ΔE*94, ΔE*cmc(2:1),ΔE*cmc(1:1), ΔE*00,DINΔE99,ΔE(Hunter) |
| Other Color Indices | Spectral Reflectance, WI (ASTM E313, CIE/ISO, AATCC, Hunter, Taube, Berger, Stensby), YI (ASTM D1925, ASTM 313), Metamerism Index MI, Staining Fastness, Shade Change Fastness, Strength, Opacity, 555 Shade Classification, Munsell (C/2), Blackness (My, dM), Color Density CMYK, Tint (Some functions realized via PC software) |
| Observer Angle | 2°/10° |
| Calibrated Illuminants | D65,A,B,C,D50,D55,D75, F1,F2(CWF),F3,F4,F5,F6,F7(DLF),F8, F9,F10(TPL5),F11(TL84),F12(TL83/U30), U35,NBF,ID50,ID65,LED-B1,LED-B2,LED-B3, LED-B4,LED-B5,LED-BH1,LED-RGB1, LED-V1,LED-V2(Partially realized via PC software) |
| Display Data | Spectral graph/data, sample color values, color difference values/graph, pass/fail results, color simulation, color bias |
| Measurement Time | Approx. 1 second |
| Repeatability |
Chromaticity Value: Within ΔE*ab 0.028 (Standard deviation) for MAV/SCI (after warm-up and calibration, average of 30 readings of white board at 5s intervals). Spectral Reflectance: Within 0.1% standard deviation for MAV/SCI (within 0.2% for 400-700nm). |
| Inter-Instrument Error | Within ΔE*ab 0.35 for MAV/SCI (average of 12 BCRA Series II color tiles). |
| Displayed Accuracy | 0.01 |
| Reflectance Range | 0-200% |
| Reflectance Resolution | 0.01% |
| Measurement Mode | Single measurement, average measurement (2-99 times). |
| Targeting | Stabilizer plate positioning + Camera framing. |
| White Calibration | Contact-type white calibration. |
| Dimensions | 120*75*207mm |
| Weight | 367g(without calibration base) |
| Battery | Lithium-ion battery, 3.7V, 3200mAh, supports 8000 measurements within 8 hours. |
| Light Source Life | Over 1.2 million measurements for 10 years. |
| Display | TFT true color 3.5-inch capacitive touch screen. |
| Interface | USB,Bluetooth |
| Data Storage | 500 standards, 10,000 samples (SCI/SCE data included in one record). Mass storage via APP/PC. |
| Software Support | Android, iOS, Windows, WeChat Mini-Program, HarmonyOS. |
| Languages | Simplified Chinese, English, Traditional Chinese |
| Operating Environment | Temperature: 0~40℃, Humidity: 0~85% RH (non-condensing), Altitude: below 2000m. |
| Storage Environment | Temperature: -20~50℃, Humidity: 0~85% RH (non-condensing). |
| Accuracy Guarantee | Ensured first-grade metrology certification |
| Standard Accessories | Power adapter, data cable, user manual, quality management software (download from official website), white calibration box, protective cover, wrist strap, measurement apertures. |
| Optional Accessories | Micro-printer, powder test box. |
| Note | Specifications are subject to change without prior notice. |
